Design for AT-Speed attempt, analysis and Measurement is the 1st publication to supply sensible and confirmed design-for-testability (DFT) options to chip and method layout engineers, attempt engineers and product managers on the silicon point in addition to on the board and structures degrees. Designers will see how the implementation of embedded try out permits simplification of silicon debug and approach bring-up. try out engineers will ascertain how embedded try presents an excellent point of at-speed try out, analysis and size with out exceeding the services in their apparatus. Product managers will find out how the time, assets and prices linked to attempt improvement, manufacture fee and lifecycle upkeep in their items might be considerably lowered by means of designing embedded try out within the product. A entire layout circulate and research of the effect of embedded attempt on a layout makes this booklet a `must learn' sooner than any DFT is tried.
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